Data | Títol | Director(s) |
---|---|---|
2019 | A versatile framework for the statistical characterization of CMOS time-zero and time-dependent variability with array-based ICs. | Rodriguez Martinez, Rosana; Martin Martinez, Javier |
2017 | Advanced nanoscale characterization concepts for copper interconnection technologies | Günther Benstetter; Rodriguez Martinez, Rosana |
2017 | Analysis of the Resistive Switching phenomenon in MOS devices for memory and logic applications | Rodriguez Martinez, Rosana |
2009 | Degradació del stack dielèctric SiO2/high-K: BTI i portadors calents | Rodriguez Martinez, Rosana |
2000 | Análisis de la degradación y ruptura dieléctrica de capas finas de SiO2 en dispositivos MOS sometidos a estreses estáticos y dinámicos. Premio extraordinario de doctorado | Nafria Maqueda, Montserrat |